The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Dec. 17, 2004
Applicants:

Jonathan M. Saint Clair, Seattle, WA (US);

Mitchell D. Voth, Sumner, WA (US);

David C. Soreide, Seattle, WA (US);

William D. Sherman, Renton, WA (US);

Inventors:

Jonathan M. Saint Clair, Seattle, WA (US);

Mitchell D. Voth, Sumner, WA (US);

David C. Soreide, Seattle, WA (US);

William D. Sherman, Renton, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are provided for targetless optical measurement and optical information projection. A non-contact optical measurement device is provided for determining at least one of position and orientation of a workpiece. A projector is provided for projecting a part definition on the workpiece. Advantageously, beams from the non-contact optical measurement device and the projector pass through common optics.


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