The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
May. 18, 2005
Mike Babin, Foster City, CA (US);
Stephen Eichblatt, San Jose, CA (US);
Xiao Z. Wu, San Jose, CA (US);
Mike Babin, Foster City, CA (US);
Stephen Eichblatt, San Jose, CA (US);
Xiao Z. Wu, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
Embodiments of the present invention include a method for measuring an angle between a first surface and a second surface of an object. The method includes rotating an object around a center axis of the object and shining a light source perpendicular to the center axis of the object. The method further includes measuring an intensity of a reflected light with respect to time and determining an angle between two or more surfaces of the object based on the intensity of the reflected light with respect to time.