The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Feb. 28, 2008
Applicants:
Sheng-an Wang, Taipei Hsien, TW;
Ming-shan Chan, Taipei Hsien, TW;
Inventors:
Sheng-An Wang, Taipei Hsien, TW;
Ming-Shan Chan, Taipei Hsien, TW;
Assignee:
Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
A lens decenter error measuring apparatus including a testing device, a lens supporter, and a lens carrier is disclosed. The testing device is configured for measuring a decenter error of a lens. The lens supporter is configured for receiving the lens. The lens carrier is installed within the lens supporter and includes at least three spheres and an elastic member. The spheres associated with the elastic member constrain the lens when the lens is placed in the lens supporter.