The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Nov. 30, 2004
Ju-hyun Lee, Seoul, KR;
Youngchul Ko, Yongin-si, KR;
Plisoo Ahn, Suwon-si, KR;
Jinwoo Cho, Seongnam-si, KR;
Serafirnovich Pavel, Suwon-si, KR;
Ju-Hyun Lee, Seoul, KR;
Youngchul Ko, Yongin-si, KR;
Plisoo Ahn, Suwon-si, KR;
Jinwoo Cho, Seongnam-si, KR;
Serafirnovich Pavel, Suwon-si, KR;
Samsung Electronics Co., Ltd, Suwon, KR;
Abstract
A scalable laser scanning angle apparatus and method of scaling a scanning angle using MEMS devices and elliptical mirrors includes disposing a first scanner at one focal point of an elliptical mirror and scanning the emitted light beam in a first direction at a first scanning angle toward a concave surface of the elliptical mirror such that the scanned light beam is directed toward the second focal point of the elliptical mirror, and scanning the light beam from the concave surface of the elliptical mirror in a second direction at a second scanning angle using a second scanner, wherein the second scanner outputs the light beam across a system scanning angle which corresponds to a combination of the first scanning angle and the second scanning angle. The scanning angle is scalable by repeatedly scanning the light beam at corresponding focal points of a predetermined number of elliptical mirrors, wherein the total scanning angle is scaled by a multiple of a number of times the light beam is scanned.