The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Mar. 20, 2007
Applicants:

Thomas M. Yonushonis, Columbus, IN (US);

Randall J. Stafford, Columbus, IN (US);

Edgar Lara-curzio, Lenior City, TN (US);

Amit Shyam, Knoxville, TN (US);

Inventors:

Thomas M. Yonushonis, Columbus, IN (US);

Randall J. Stafford, Columbus, IN (US);

Edgar Lara-Curzio, Lenior City, TN (US);

Amit Shyam, Knoxville, TN (US);

Assignee:

Cummins Filtration IP, Inc, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01); G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event.


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