The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Dec. 28, 2005
Applicants:

Hiroyuki Hashimoto, Yokohama, JP;

Katsuaki Kuge, Yokohama, JP;

Manabu Komatsu, Kawasaki, JP;

Kumi Nakamura, Isehara, JP;

Kazuhiro Ban, Tokyo, JP;

Takeshi Imamura, Chigasaki, JP;

Shin Kobayashi, Kawasaki, JP;

Tadashi Okamoto, Yokohama, JP;

Inventors:

Hiroyuki Hashimoto, Yokohama, JP;

Katsuaki Kuge, Yokohama, JP;

Manabu Komatsu, Kawasaki, JP;

Kumi Nakamura, Isehara, JP;

Kazuhiro Ban, Tokyo, JP;

Takeshi Imamura, Chigasaki, JP;

Shin Kobayashi, Kawasaki, JP;

Tadashi Okamoto, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 17/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An information acquisition method for acquiring information on a target object, that includes a step of promoting ionization of the target object using a substance for promoting ionization of the target object to cause the target object to emit, and a step of acquiring information on the mass of the flew target object using time-of-flight secondary ion mass spectrometry.


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