The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7700908 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 20, 2010

Filed:

Jun. 08, 2007
Applicants:

Wei-chih Wang, Sammamish, WA (US);

Per G. Reinhall, Seattle, WA (US);

Inventors:

Wei-Chih Wang, Sammamish, WA (US);

Per G. Reinhall, Seattle, WA (US);

Assignee:

University of Washington, Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

An ultra high speed miniature two dimensional electro-optic image acquisition system uses prisms of varying geometries to control the amount of horizontal deflection and a Bragg grating to control the amount of vertical deflection. A collimating lens array and a Gaussian profile Bragg grating help confine the beam diameter of the deflected light beam. A separate prism further bends light into the vertical direction. A spherical lens focuses light onto a photodetector array for display.


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Wang, Wei-Chih. (2010). Two dimensional optical scanning image system (U.S. Patent No. 7700908). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7700908

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