The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 20, 2010
Filed:
Jan. 09, 2006
Yanbin LI, Fayetteville, AR (US);
Madhukar Varshney, Fayetteville, AR (US);
Zunzhang YE, Fayetteville, AR (US);
Yanbin Li, Fayetteville, AR (US);
Madhukar Varshney, Fayetteville, AR (US);
Zunzhang Ye, Fayetteville, AR (US);
Board of Trustees of the University of Arkansas, Little Rock, AR (US);
Abstract
Methods are disclosed for the capture, detection, separation, isolation and quantification of contaminants in a starting material. Also disclosed are competitive assay methods for the detection and quantification of contaminants in a starting material. Kits for use with the method are disclosed as well. A system for capturing, separating and/or concentrating contaminants from a material is also presented. The system captures, separates and/or concentrates contaminants such as bacteria, viruses, other microorganisms, and/or larger items, such as insects, from a variety of materials, such as food, and environmental and clinical materials. In general, the system uses a rotating magnetic field to mix the material with magnetic particles to capture the target contaminants, and a fixed magnetic field to separate and concentrate the captured target contaminants.