The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 20, 2010

Filed:

Jun. 15, 2004
Applicant:

Taizo Kobayashi, Kyoto, JP;

Inventor:

Taizo Kobayashi, Kyoto, JP;

Assignee:

Arkray, Inc., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to an analytical tool (X) which includes a substrate (), a flow path for moving a sample along the substrate (), a reagent portion () provided in the flow path, and an insulating film () covering the substrate () and including an opening () for defining a region for forming the reagent portion (). The insulating film () further includes at least one additional opening () positioned in a longitudinal direction (N) relative to the opening (). For instance, the flow path is configured to move the sample by capillary force.


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