The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Jul. 12, 2005
Mizuki Oka, Tsukuba, JP;
Kazuhiko Kato, Tsukuba, JP;
Mizuki Oka, Tsukuba, JP;
Kazuhiko Kato, Tsukuba, JP;
Japan Science and Technology Agency, Kawaguchi-shi, JP;
Abstract
The present invention aims at providing a sequential data examination method which can increase data examination accuracy compared with the prior art. The similarity is calculated between a layered network model generated from learning sequential data to be learned and a layered network model generated from testing sequential data to be tested. Based on the similarity, it is determined whether or not the testing sequential data to be tested belong to one or more categories. A network model for each layer of the layered network model is constructed by multiplying an element of the feature vector and its corresponding Eigen co-occurrence matrix.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile