The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Jan. 22, 2007
Applicants:

Alper Buyuktosunoglu, White Plains, NY (US);

Ruhi Sarikaya, Shrub Oak, NY (US);

Inventors:

Alper Buyuktosunoglu, White Plains, NY (US);

Ruhi Sarikaya, Shrub Oak, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An objective function is dynamically chosen from a pool of available objective functions, and a prediction model is dynamically chosen from a pool of available prediction models. Points of inflection are determined for the chosen objective function, based on past values of a metric, to obtain a set of equations that can be solved to obtain model parameters associated with the chosen prediction model. The equations are solved to obtain the model parameters, and a future value of the metric is predicted based on (i) at least some of the past values of the metric and (ii) the chosen prediction model, with the obtained associated model parameters.


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