The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

May. 20, 2008
Applicant:

Charles A. Lee, Camarillo, CA (US);

Inventor:

Charles A. Lee, Camarillo, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01C 21/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

First and second inertial instruments have parallel sense axes and produce respective first and second output signals using associated first and second scale factors. Bias errors are estimated using the change in state of sign of the first and second scale factors. A substitute scale factor is determined to be an equivalent of the second scale factor and is based on the first scale factor and a difference between the first and second scale factors. Errors in the second scale factor are calculated based on the first scale factor and the substitute scale factor where a sign of one of first and second scale factors changes going from the first time interval to the succeeding time intervals. First and second corrected output signals are generated based on the respective first and second output signals and correction of the second scale factor error.


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