The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Nov. 28, 2007
Applicants:
Dhruva J. Acharyya, Austin, TX (US);
Kanak B. Agarwal, Austin, TX (US);
Inventors:
Dhruva J. Acharyya, Austin, TX (US);
Kanak B. Agarwal, Austin, TX (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Measurement of individual quiescent supply currents from multiple power supply pads located across a semiconductor die provides a means of characterizing across-die variation. A ratio is created by combining the individual pad supply current with the sum of all pad supply currents for a given die. An n-tuple is formed from the set of ratios for all pad supply currents to provide a unique signature for different across-die variation profiles.