The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Dec. 03, 2004
Applicants:

Scott A. Boyden, Knoxville, TN (US);

Stephen Piche, Austin, TX (US);

Inventors:

Scott A. Boyden, Knoxville, TN (US);

Stephen Piche, Austin, TX (US);

Assignee:

ALSTOM Technology Ltd., Windsor, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/02 (2006.01); G05B 21/00 (2006.01); G06F 17/00 (2006.01); G06F 19/00 (2006.01); G01N 31/00 (2006.01); B01D 50/00 (2006.01); B01D 53/34 (2006.01); B01D 53/56 (2006.01); B01D 53/86 (2006.01); B01D 53/50 (2006.01); C01B 21/00 (2006.01); F01N 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A controller is provided for directing control of a process performed to control an amount of a pollutant emitted into the air. The process has multiple process parameters (MPPs) The controller includes either a neural network process model or a non-neural network process model. Whichever type model is included, it will represent a relationship between one of the MPPs and other of the MPPs. The controller also includes a control processor having the logic to determine the validity of a measured value of the one MPP based on the one model. The control processor directs control of the process in accordance with the measured value of the one MPP only if the measured value of the one MPP is determined to be valid. On the other hand, if the measured value is determined to be invalid, the control processor may direct control of the process in accordance with an estimated value of the one MPP.


Find Patent Forward Citations

Boyden, Scott. (2010). Apc process control when process parameters are inaccurately measured (U.S. Patent No. 7698004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7698004

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…