The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Jan. 18, 2005
Jinguang Wu, Beijing, CN;
Yuanfu Zhang, Changchun, CN;
Yizhuang Xu, Beijing, CN;
Qingbo LI, Beijing, CN;
Shifu Weng, Beijing, CN;
Limin Yang, Beijing, CN;
LI Zhang, Beijing, CN;
Weijin Zhou, Beijing, CN;
Zhanlan Yang, Beijing, CN;
Weihong LI, Beijing, CN;
Huizhong Wu, Beijing, CN;
Rongye Gong, Beijing, CN;
Xuejun Gao, Beijing, CN;
Duanfu Xu, Beijing, CN;
Ying Zhao, Beijing, CN;
Zhi Xu, Beijing, CN;
Nengwei Zhang, Beijing, CN;
Lixin Wang, Beijing, CN;
Kaihua Sun, Beijing, CN;
Xin Peng, Beijing, CN;
Yufeng Liu, Beijing, CN;
Xuejun Sun, Xi'an, CN;
Xiaofeng Ling, Beijing, CN;
Su Zhou, Beijing, CN;
Zhi Liu, Beijing, CN;
Guoqiao Lai, Wenyi Road, CN;
Jianxiong Jiang, Wenyi Road, CN;
Qinghua Pan, Wenyi Road, CN;
Qiguang Wu, Haidian District, CN;
Guangyan Yu, Haidian District, CN;
Bingbing Wang, Beijing, CN;
Jinguang Wu, Beijing, CN;
Yuanfu Zhang, Changchun, CN;
Yizhuang Xu, Beijing, CN;
Qingbo Li, Beijing, CN;
Shifu Weng, Beijing, CN;
Limin Yang, Beijing, CN;
Li Zhang, Beijing, CN;
Weijin Zhou, Beijing, CN;
Zhanlan Yang, Beijing, CN;
Weihong Li, Beijing, CN;
Huizhong Wu, Beijing, CN;
Rongye Gong, Beijing, CN;
Xuejun Gao, Beijing, CN;
Duanfu Xu, Beijing, CN;
Ying Zhao, Beijing, CN;
Zhi Xu, Beijing, CN;
Nengwei Zhang, Beijing, CN;
Lixin Wang, Beijing, CN;
Kaihua Sun, Beijing, CN;
Xin Peng, Beijing, CN;
Yufeng Liu, Beijing, CN;
Xuejun Sun, Xi'an, CN;
Xiaofeng Ling, Beijing, CN;
Su Zhou, Beijing, CN;
Zhi Liu, Beijing, CN;
Guoqiao Lai, Wenyi Road, CN;
Jianxiong Jiang, Wenyi Road, CN;
Qinghua Pan, Wenyi Road, CN;
Qiguang Wu, Haidian District, CN;
Guangyan Yu, Haidian District, CN;
Bingbing Wang, Beijing, CN;
Peking University, Beijing, P.R., CN;
Beijing Second Optical InstrumentFacotry, Beijing, P.R., CN;
Abstract
The invention relates to a non-invasive method to diagnose the changes of molecular structures of organism tissues from body surface and a dedicated apparatus. The apparatus is comprised of a Fourier Transform infrared spectrometer and a set of additional accessories. Said additional accessories include a mid-IR fiber optics sampling attachment, a fiber coupling part, and an infrared detector part. The detection method is comprised of placing the ATR probe of the dedicated apparatus on the skin surface of a region to be tested, and scanning more than one time in which the resolution of the apparatus is 1-32 cmand the range of the spectrum is 800-4000 cm. It is possible to detect changes in molecular structures of living biological tissues in the early stages of cancer, and testees will not feel uncomfortable during testing. The method is easy to operate, quick, accurate, and it doesn't harm the body.