The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Sep. 29, 2004
Applicants:
Shih-jong J. Lee, Bellevue, WA (US);
Samuel Alworth, Seattle, WA (US);
Inventors:
Shih-Jong J. Lee, Bellevue, WA (US);
Samuel Alworth, Seattle, WA (US);
Assignee:
DRVision Technologies LLC, Bellevue, WA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/34 (2006.01); G06K 9/62 (2006.01); G06K 9/46 (2006.01); G06K 9/66 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract
An object analysis method performs object segmentation to generate segmentation confidence map and uses the segmentation results to generate robust object features. The robust object features are combined to create robust FOV summary features, robust sample summary features and robust assay summary features.
Quick Actions:
Lee, Shih-Jong. (2010). Method for robust analysis of biological activity in microscopy images (U.S. Patent No. 7697755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7697755
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile