The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Aug. 16, 2006
Hitoshi Okamura, Seongnam-si, KR;
Hitoshi Okamura, Seongnam-si, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
A circuit for measuring an eye size generates first sampled data by sampling received data with recovered clock signals and generates second sampled data by sampling the received data with shifted clock signals, in which the recovered clock signals, having different phases, are recovered from the received data. The shifted clock signals are obtained by shifting each phase of at least one of recovered clock signals by respectively predetermined phases. The circuit generates error counts for calculating the eye size of the received data by comparing the first sampled data and the second sampled data and measures the eye size by obtaining a phase range where the error counts are equal to zero. Therefore, the circuit may measure the eye size without interference of frequency offsets and/or jitter of the received data.