The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Oct. 26, 2005
Applicants:

Akira Mashimo, Tokorozawa, JP;

Keishi Ueno, Iruma, JP;

Inventors:

Akira Mashimo, Tokorozawa, JP;

Keishi Ueno, Iruma, JP;

Assignee:

TEAC Coporation, Tama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection apparatus for inspecting a phase modulated wobble track of an optical disk is provided. A radial push-pull signal (a wobble signal) of an optical disk is supplied to a low pass filter where a phase boundary portion of the wobble signal is smoothed, and then binarized by a binarizer and supplied to a time interval analyzer. The time interval analyzer analyzes a period of the binary wobble signal to extract two peak values Tand Tthereof. An operation device computes a difference value of the two periods Tand Tand a standard deviation of each peak, and compares each computed value to a threshold value for simultaneously evaluating CNR and a phase shift. The low pass filter and the binarizer may be incorporated into an optical disk apparatus for smoothing the phase boundary portion of the reproduced wobble signal.


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