The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Apr. 07, 2006
Applicants:

Chun-ying Chiang, Chiayi, TW;

Ming-hung Lee, Taipei County, TW;

Shu-fang Tsai, Hsinchu, TW;

Inventors:

Chun-Ying Chiang, Chiayi, TW;

Ming-Hung Lee, Taipei County, TW;

Shu-Fang Tsai, Hsinchu, TW;

Assignee:

MediaTek Inc., Hsin-Chu, Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A defect management method applied in an optical disc drive for managing defect information of an optical disc is disclosed. The optical disc drive saves a plurality of defect tables comprising at least a first defect table and a second defect table. The first defect table records a plurality of first defect entries and the second defect table records a plurality of second defect entries. The method includes appending an adaptive defect entry comprising a new defect information corresponding to a new defect into a new defect table, a data structure of the adaptive defect entry conforming to a data structure of at least one of the defect entries recorded in the defect tables; and merging the adaptive defect entries into one of the defect tables saved in the optical disc drive when a condition is met.


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