The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Apr. 02, 2009
Matthias Wagner, Cambridge, MA (US);
Shuyun Wu, Acton, MA (US);
Charles M. Marshall, North Andover, MA (US);
Eugene Y. MA, Newton, MA (US);
John F. Heanue, Manchester, MA (US);
Matthias Wagner, Cambridge, MA (US);
Shuyun Wu, Acton, MA (US);
Charles M. Marshall, North Andover, MA (US);
Eugene Y. Ma, Newton, MA (US);
John F. Heanue, Manchester, MA (US);
Redshift Systems Corporation, Burlington, MA (US);
Abstract
A thin-film interference filter structure has a generally wavelength-dependent resonant response to incident optical energy in a predetermined range of wavelengths. The thin-film interference filter structure includes a thermally tunable layer having a thermally tunable optical characteristic such that a range of wavelength-dependent resonant optical responses of the thermally tunable layer are induced by a corresponding range of thermal conditions of the thermally tunable layer. The thin-film interference filter structure is configured to (1) receive a spatially varying pattern of thermal energy at the thermally tunable layer to impart a corresponding spatially varying pattern to the thermally tunable characteristic of the thermally tunable layer, and (2) receive the incident optical energy into the thermally tunable layer and output optical energy having spatial modulation corresponding to the spatially varying pattern of the thermally tunable characteristic.