The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Dec. 21, 2007
Kenneth R. Ossman, Macedon, NY (US);
R. Enrique Viturro, Rochester, NY (US);
Kenneth R. Ossman, Macedon, NY (US);
R. Enrique Viturro, Rochester, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
This invention relates to a method for the calibration of linear array photo sensors operating in a specular reflection mode. Errors may be introduced when a highly diffused image is measured by the linear array photosensor that was calibrated in a specular mode. These errors result in artifacts such as streaks in the captured image. The method measures non-uniformity errors using a highly diffuse white reflective surface, and then applies an appropriate scaled pixel-wise correction factor to the image when the sensor is used in the specular mode.