The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Apr. 16, 2008
Kenneth D. Konopa, Mercer Island, WA (US);
Paul Heydron, Everett, WA (US);
Kenneth D. Konopa, Mercer Island, WA (US);
Paul Heydron, Everett, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A method and apparatus for automating a quality assurance test conducted on display devices used for diagnostic imaging. In one embodiment, the apparatus includes an automated mechanical system for scanning a light meter over a test pattern displayed on a display device. In another embodiment, the method comprises an automated method of comparing the measured data from the light meter with an ideal image. In another embodiment, the method comprises obtaining a digital image of the test pattern displayed on the display device, and the digital image is compared with an ideal image.