The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Dec. 15, 2006
Applicants:

Daniel Hui Bon Hoa, Lannion, FR;

Paulette Gavignet, Tregastel, FR;

Christian Dourthe, Lannion, FR;

Inventors:

Daniel Hui Bon Hoa, Lannion, FR;

Paulette Gavignet, Tregastel, FR;

Christian Dourthe, Lannion, FR;

Assignee:

France Telecom, Paris, FR;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Apparatus for measuring the differential group delay τin an optical fiber connection. The apparatus comprises at the inlet to said connection, a generator () for generating a binary signal sequence at a data rate D and a first polarization controller () suitable for subjecting the binary signal of an incoming sequence to a first scan through polarization states; and at the outlet from the connection, a second polarization controller () suitable for subjecting the signal resulting from the outgoing sequence to a second scan through polarization states, independently of said first polarization scan, a differential group delay emulator () suitable for introducing a variable additional group delay τ, and an analyzer device () suitable for detecting the equality τ+τ=1/D in the resulting signal sequence.


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