The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Dec. 05, 2005
Toshiyuki Hattori, Tokyo, JP;
Mitsuhiro Nakano, Tokyo, JP;
Yusuke Yamashita, Tokyo, JP;
Hiroshi Hirayama, Tokyo, JP;
Tatsuo Nakata, Tokyo, JP;
Toshiyuki Hattori, Tokyo, JP;
Mitsuhiro Nakano, Tokyo, JP;
Yusuke Yamashita, Tokyo, JP;
Hiroshi Hirayama, Tokyo, JP;
Tatsuo Nakata, Tokyo, JP;
Olympus Corporation, Tokyo, JP;
Abstract
A laser scanning microscope capable of quickly and accurately setting control values of control items for a microscope apparatus is provided. The control items and a time line are displayed along a vertical axis and a horizontal axis, respectively. The laser scanning microscope includes a graphical user interface configured to set the control values of the control items along the time line and a control unit configured to acquire luminance information of a specimen by irradiating the specimen with a laser beam in accordance with the control values set by the graphical user interface.