The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7696855 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 13, 2010

Filed:

Apr. 17, 2007
Applicants:

Takeshi Sugimoto, Mitaka, JP;

Hiroaki Furukawa, Fuchu, JP;

Yasuhiro Uchino, Mitaka, JP;

Inventors:

Takeshi Sugimoto, Mitaka, JP;

Hiroaki Furukawa, Fuchu, JP;

Yasuhiro Uchino, Mitaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/22 (2006.01);
U.S. Cl.
CPC ...
Abstract

The strain gauge for measuring large strains has metallic foil pattern sections including a gauge element pattern section, gauge tab pattern sections and connecting pattern sections attached to a gauge base. The gauge base having the metallic foil pattern sections attached and connected with the bases of gauge leads is almost entirely covered on the surface with a laminating film, and the tip of the laminating film is extended by a predetermined length from the tip end of the gauge base, to form a protruding portion. The protruding portion functions to prevent the separation of the gauge base from an object to be measured.


Find Patent Forward Citations

Sugimoto, Takeshi. (2010). Strain gauge for measuring large strains (U.S. Patent No. 7696855). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7696855

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…