The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Nov. 30, 2007
Toshimichi Ogisu, Tokyo, JP;
Noritsugu Nakamura, Tokyo, JP;
Nobuo Takeda, Tokyo, JP;
Fuji Jukogyo Kabushiki Kaisha, Shinjuku-ku, Tokyo, JP;
The University of Tokyo, Bunkyo-ku, Tokyo, JP;
Abstract
Disclosed is an impact detection system including: an optical fiber including a plurality of sensor sections to reflect light, a wavelength band of the reflected light vibrates depending on an elastic wave propagating through a subject to be inspected; a light source to input light into the optical fiber; optical filters each connected to an output terminal of the optical fiber; and an arithmetic processing unit to detect the impact from output values of sensor sections, wherein the wavelength bands of the sensor sections in the optical fiber are distributed such that the vibration bands caused by the impact to be detected do not overlap with each other, and a pass band of the optical filter corresponding to one of the sensor sections is distributed in the vibration band caused by the detection object, and is distributed in both sides of a center of the wavelength band of the one sensor section.