The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Jun. 07, 2006
Applicants:

Michael B. Gorin, Pittsburgh, PA (US);

Johanna Jakobsdottir, Pittsburgh, PA (US);

Yvette P. Conley, White Oak, PA (US);

Daniel E. Weeks, Pittsburgh, PA (US);

Tammy S. Mah-fraser, Edmonton, CA;

Robert E. Ferrell, Pittsburgh, PA (US);

Inventors:

Michael B. Gorin, Pittsburgh, PA (US);

Johanna Jakobsdottir, Pittsburgh, PA (US);

Yvette P. Conley, White Oak, PA (US);

Daniel E. Weeks, Pittsburgh, PA (US);

Tammy S. Mah-Fraser, Edmonton, CA;

Robert E. Ferrell, Pittsburgh, PA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Allelic variations in the genes PLEKHA1 and LOC387715 are identified herein as risk factor for Age Related Maculopathy (ARM). A method is therefore provided for identifying a risk of development of ARM in an individual that comprises identification of allelic variations in PLEKHA1 and/or LOC387715. Related apparatus, such as an array, are identified as being useful in implementing those methods.


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