The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Mar. 19, 2004
Applicants:

M. Selim Unlu, Jamaica Plain, MA (US);

David A. Bergstein, Allston, MA (US);

Michael F. Ruane, Brookline, MA (US);

Bennett B. Goldberg, Newton, MA (US);

Inventors:

M. Selim Unlu, Jamaica Plain, MA (US);

David A. Bergstein, Allston, MA (US);

Michael F. Ruane, Brookline, MA (US);

Bennett B. Goldberg, Newton, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/03 (2006.01); G02B 6/00 (2006.01); G01N 21/41 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

An assay system having a channel bounded by first and second reflective surfaces adapted to accommodate a fluid material therebetween and defining a plurality of regions in an array between those surfaces with each region defining a resonant cavity and adapted to receive a capturing material on a surface thereof whereby a source of radiation illuminates each region to provide a standing wave of radiation of within the cavity indicative of binding of said capturing agent to material under investigation, a binding thereof being detected in response to radiation from each cavity indicative of a change in the standing wave pattern.


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