The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Oct. 25, 2006
Thomas Flohr, Uehlfeld, DE;
Michael Grasruck, Erlangen, DE;
Hubertus Pietsch, Kleinmachnow, DE;
Karl Stierstorfer, Erlangen, DE;
Christoph Suss, Erlangen, DE;
Hanns-joachim Weinmann, Berlin, DE;
Thomas Flohr, Uehlfeld, DE;
Michael Grasruck, Erlangen, DE;
Hubertus Pietsch, Kleinmachnow, DE;
Karl Stierstorfer, Erlangen, DE;
Christoph Suss, Erlangen, DE;
Hanns-Joachim Weinmann, Berlin, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
An x-ray system is disclosed including a selector for finding an optimum combination between the contrast medium and the energy spectrum of an x-radiation for a scan to optimize the noise-to-contrast ratio. A method for creating X-ray images is also provided. The x-ray images are created with the aid of contrast media by taking into account an optimal combination between the contrast medium and the energy spectrum of an X-radiation used for a scan. A method for the use of a lanthanide-containing complex to produce a contrast medium for optimizing the combination between the contrast medium and the radiation to obtain a maximum contrast-to-noise ratio in an X-ray image is also provided.