The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 13, 2010
Filed:
Nov. 07, 2007
David B. Hatfield, Oracle, AZ (US);
Terry M. Sanderson, Tucson, AZ (US);
Renee M. Rodgers, Sahuarita, AZ (US);
David B. Hatfield, Oracle, AZ (US);
Terry M. Sanderson, Tucson, AZ (US);
Renee M. Rodgers, Sahuarita, AZ (US);
Raytheon Company, Waltham, MA (US);
Abstract
A method of evaluating material properties of polymeric materials includes making one or more material samples or slabs, with each of the samples or slabs having a pair of material layers in contact with one another. The layers are layers of organic matrix polymer material that have different characteristics from each other, for example having a difference in composition and/or cure characteristics. Characteristics of the test slabs and the interface between the layers can be determined by examining curvatures of the test slabs. A number of samples may be made up having the same material in a first layer, and range of different materials in the respective second layers. The range may cover a range of various material compositions and/or cure characteristics.