The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 13, 2010

Filed:

Dec. 28, 2007
Applicants:

Qing Liu, Shenzhen, CN;

Jun-qi LI, Shenzhen, CN;

Inventors:

Qing Liu, Shenzhen, CN;

Jun-Qi Li, Shenzhen, CN;

Assignees:

Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., Shenzhen, Guangdong Province, CN;

Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01);
U.S. Cl.
CPC ...
Abstract

An exemplary measuring device includes a standard element, a first contour measuring probe, and a controller. The standard element has a first standard plane opposite to a measured object. The first contour measuring probe has a tip extension. The controller is electrically connected to the first contour measuring probe. The tip extension contacts the first standard plane during a measuring process. In addition, a method for using the measuring device is also provided.


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