The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Jul. 18, 2007
Applicants:

Glenn A. Forrest, Bow, NH (US);

Washington Lamar, Mont Vernon, NH (US);

Inventors:

Glenn A. Forrest, Bow, NH (US);

Washington Lamar, Mont Vernon, NH (US);

Assignee:

Allegro Microsystems, Inc., Worcester, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An integrated circuit and a method of built-in self test in the integrated circuit employ an offset control node and offset capabilities with the integrated circuit in order to communicate and distribute a built-in self-test signal. The built-in self-test signal can emulate signals internal to the integrated circuit during normal operation, and/or the built-in self-test signal can have other signal characteristics representative of signals other than those signals internal to the integrated circuit during normal operation.


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