The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Nov. 20, 2007
Josef Schnell, Charlotte, VT (US);
Klaus Hummler, Apex, NC (US);
Jong Hoon OH, Chapel Hill, NC (US);
Wayne Frederick Ellis, Jericho, VT (US);
Jung Pill Kim, Cary, NC (US);
Oliver Kiehl, Charlotte, VT (US);
Octavian Beldiman, South Burlington, VT (US);
Lee Ward Collins, Cary, NC (US);
Josef Schnell, Charlotte, VT (US);
Klaus Hummler, Apex, NC (US);
Jong Hoon Oh, Chapel Hill, NC (US);
Wayne Frederick Ellis, Jericho, VT (US);
Jung Pill Kim, Cary, NC (US);
Oliver Kiehl, Charlotte, VT (US);
Octavian Beldiman, South Burlington, VT (US);
Lee Ward Collins, Cary, NC (US);
Qimonda North America Corp., Cary, NC (US);
Abstract
The present invention is generally related to integrated circuit devices, and more particularly, to methods and systems of a multi-chip package (MCP) containing a self-diagnostic scheme for detecting errors in the MCP. The MCP generally comprises a controller, at least one volatile memory chip having error detection logic, at least one non-volatile memory chip, and at least one fail signature register for storing fail signature data related to memory errors detected in the MCP. The controller can poll the fail signature register for fail signature data related to memory errors stored therein. Upon detection of fail signature data, the controller can store the fail signature data on a fail signature register located on a non-volatile memory.