The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Jun. 21, 2007
Wen-tau Yih, Redmond, WA (US);
Joshua T. Goodman, Redmond, WA (US);
Geoffrey J. Hulten, Lynnwood, WA (US);
Wen-tau Yih, Redmond, WA (US);
Joshua T. Goodman, Redmond, WA (US);
Geoffrey J. Hulten, Lynnwood, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A system and method that facilitates and effectuates optimizing a classifier for greater performance in a specific region of classification that is of interest, such as a low false positive rate or a low false negative rate. A two-stage classification model can be trained and employed, where the first stage classification is optimized over the entire classification region and the second stage classifier is optimized for the specific region of interest. During training the entire set of training data is employed by a first stage classifier. Only data that is classified by the first stage classifier or by cross validation to fall within a region of interest is used to train the second stage classifier. During classification, data that is classified within the region of interest by the first classification is given the first stage classifier's classification value, otherwise the classification value for the instance of data from the second stage classifier is used.