The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Sep. 03, 2004
Applicants:

Rupert A. Schmidtberg, Westford, MA (US);

Jeffrey Allen Leshuk, Davis, CA (US);

Inventors:

Rupert A. Schmidtberg, Westford, MA (US);

Jeffrey Allen Leshuk, Davis, CA (US);

Assignee:

Sensitech Inc., Beverly, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to systems and methods for collecting data concerning a supply chain, for performing statistical analysis on the collected data to facilitate identification of anomalies or inefficiencies in the process, and for communicating results of such statistical analysis to those responsible for the supply chain. A method for performing statistical analysis on monitored aspect of a product supply chain involves storing, in memory accessible to processor, first data reflecting first monitored aspect of a first shipment of first item occurring in the supply chain, and storing, in memory accessible to the processor, second data reflecting second monitored aspect of a second shipment of second item occurring in the supply chain. The processor is used to automatically generate report reflecting statistical analysis of the first and second data.


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