The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Dec. 20, 2007
Applicants:

Jun Koshoubu, Hachioji, JP;

Tetsuji Sunami, Hachioji, JP;

Kenichi Akao, Hachioji, JP;

Keisuke Watanabe, Hachioji, JP;

Inventors:

Jun Koshoubu, Hachioji, JP;

Tetsuji Sunami, Hachioji, JP;

Kenichi Akao, Hachioji, JP;

Keisuke Watanabe, Hachioji, JP;

Assignee:

JASCO Corporation, Hachioji-shi, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03H 1/26 (2006.01); H04B 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.


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