The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Jul. 27, 2006
Applicants:

Zhibin Cheng, Cary, NC (US);

Aleksandr Kaplun, Whitsett, NC (US);

Inventors:

Zhibin Cheng, Cary, NC (US);

Aleksandr Kaplun, Whitsett, NC (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatuses to measure temperatures of integrated circuits are disclosed. New circuit arrangements for measuring temperature using various types of integrated circuit sensor elements are discussed. Embodiments comprise methods and apparatuses arranged to measure temperature based upon current leakage rates of different integrated circuit sensor elements. The methods and apparatuses generally involve using a pulse module to generate a charge for the integrated circuit elements. In these method and apparatus embodiments, one or more elements form a decay module to sense when the voltage decays to a threshold value. The method and apparatus embodiments may also have a module to calculate or infer a temperature from the rate of the voltage decay.


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