The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Nov. 22, 2006
Applicants:
Xiaojun Chen, San Gabriel, CA (US);
Lianshan Yan, Monterey Park, CA (US);
X. Steve Yao, Diamond Bar, CA (US);
Inventors:
Xiaojun Chen, San Gabriel, CA (US);
Lianshan Yan, Monterey Park, CA (US);
X. Steve Yao, Diamond Bar, CA (US);
Assignee:
General Photonics Corporation, Chino, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 10/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
Techniques and devices that use polarization rotation and optical interferometry to provide optical spectrum analysis of an optical signal.
Chen, Xiaojun. (2010). Optical spectrum analysis using optical interferometry (U.S. Patent No. 7693419). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7693419
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile