The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Jun. 13, 2005
Applicants:

Minos N. Garofalakis, Morristown, NJ (US);

Amit Kumar, New Delhi, IN;

Inventors:

Minos N. Garofalakis, Morristown, NJ (US);

Amit Kumar, New Delhi, IN;

Assignee:

Alcatel-Lucent USA Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

Novel, computationally efficient schemes for deterministic wavelet thresholding with the objective of optimizing maximum-error metrics are provided. An optimal low polynomial-time algorithm for one-dimensional wavelet thresholding based on a new dynamic-programming (DP) formulation is provided that can be employed to minimize the maximum relative or absolute error in the data reconstruction. Directly extending a one-dimensional DP algorithm to multi-dimensional wavelets results in a super-exponential increase in time complexity with the data dimensionality. Thus, novel, polynomial-time approximation schemes (with tunable approximation guarantees for the target maximum-error metric) for deterministic wavelet thresholding in multiple dimensions are also provided.


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