The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Jun. 14, 2006
Fuyun Ling, San Diego, CA (US);
Thomas Sun, San Diego, CA (US);
Raghuraman Krisnamoorthi, San Diego, CA (US);
Durk L. Van Veen, Santee, CA (US);
Murali Ramaswamy Chari, San Diego, CA (US);
Fuyun Ling, San Diego, CA (US);
Thomas Sun, San Diego, CA (US);
Raghuraman Krisnamoorthi, San Diego, CA (US);
Durk L. van Veen, Santee, CA (US);
Murali Ramaswamy Chari, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
The claimed subject matter relates to estimating noise variance associated with a transmitter. For example, the noise variance can be estimated in connection with determining performance parameters associated with a transmitter. Determining noise variance can include the acts of estimating phase alteration of a received signal through utilization of a least squares-based phase estimation algorithm. Determining noise variance can also include the act of determining an unbiased estimation of noise variance as a function of the estimated phase alteration.