The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Nov. 29, 2006
Applicants:

Hee-jin Roh, Suwon-si, KR;

Su-jin Yoon, Suwon-si, KR;

Min-goo Kim, Yongin-si, KR;

Inventors:

Hee-Jin Roh, Suwon-si, KR;

Su-Jin Yoon, Suwon-si, KR;

Min-Goo Kim, Yongin-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 1/00 (2006.01); H04L 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method for carrier frequency synchronization in an Orthogonal Frequency Division Multiplexing (OFDM) system are provided for correcting an initial carrier frequency offset in the OFDM system. A metric generator for frequency estimation performs a first accumulation process for a value computed by multiplying a Phase Reference Symbol (PRS) generated from a reception stage by a Fast Fourier Transform (FFT) output signal for an OFDM symbol in a PRS position within a frame, acquires a differential symbol from a product of adjacent FFT output symbols, performs a second accumulation process for a real part extracted from the differential symbol, and outputs a metric value for the frequency estimation. A maximal value-related index generator compares metric values for initial frequency estimation within a predetermined frequency offset estimation range, and selects and outputs a maximal metric value as a frequency offset estimate.


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