The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

May. 30, 2007
Applicants:

Bing-yu Hsieh, Taipei, TW;

Yuh Cheng, Hsin-Chu County, TW;

Shu-hung Chou, Taipei County, TW;

Jung-feng Ho, Keelung, TW;

Inventors:

Bing-Yu Hsieh, Taipei, TW;

Yuh Cheng, Hsin-Chu County, TW;

Shu-Hung Chou, Taipei County, TW;

Jung-Feng Ho, Keelung, TW;

Assignee:

Mediatek Inc., Hsin-Chu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides an apparatus for demodulating an Address In Pre-groove (ADIP) symbol. The ADIP symbol is carried by a wobble signal of an optical disk and comprises a series of ADIP bits permuted according to one of a plurality of permutation patterns to make up the ADIP symbol. A wobble extraction module extracts the wobble signal from the optical disk. A reference wobble generator generates a reference wobble with the same frequency and phase as a fundamental frequency and phase of a positive wobble cycle of the wobble signal. A waveform difference measurement module then measures a difference between the wobble signal and the reference wobble to obtain a series of difference measurement values respectively corresponding to the ADIP bits. A pattern matching module then compares probabilities of the permutation of the ADIP bits agreeing with each of the permutation patterns according to the difference measurement values to determine the ADIP symbol.


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