The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Jun. 29, 2007
Joerg Steinert, Jena, DE;
Matthias Wald, Kunitz, DE;
Saskia Pergande, Jena, DE;
Carl Zeiss MicroImaging GmbH, Jena, DE;
Abstract
A correction device for an imaging optical arrangement exhibiting a light path (), in particular for a microscope, that exhibits at least one plane-parallel transparent plate (), which is held in a mounting plate in the image beam path () and is propelable around at least one axle in a tipping and/or a swiveling motion, in order in adjust a definite parallel misalignment of the beams in the image beam path () by a change in the tipping situation of the plate (). A confocal microscope with such a correction device exhibits a confocal screen (), which illustrates a specimen mark (), whereby the plane-parallel plate () is placed in front of the detector unit () in the light path (), in order to center the illustration of the aperture diaphragm on the detector unit.