The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Nov. 29, 2007
Applicants:
Christopher Lin, El Cerrito, CA (US);
Deepak Devicharan, Horseheads, NY (US);
Inventors:
Christopher Lin, El Cerrito, CA (US);
Deepak Devicharan, Horseheads, NY (US);
Assignee:
Oclaro North America Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01J 3/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
The specification describes an optical wavelength monitor/analyzer that uses a cost effective wavelength reference source. The wavelength reference source is a nominally fixed wavelength laser with inherent tunability over a very limited wavelength range, i.e. a few nanometers. Tuning is effected by changing the temperature of the laser. The limited range is useful for making multiple wavelength measurements in the context of analyzing wavelength drift in tunable optical filters.