The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Mar. 29, 2007
Willam Scott Sutherland, Haverhill, MA (US);
Anis Zribi, Rexford, NY (US);
Long Que, Rexford, NY (US);
Glenn Scott Claydon, Wynantskill, NY (US);
Stacey Joy Kennerly, Albany, NY (US);
Ayan Banerjee, Bangalore, IN;
Shivappa Ningappa Goravar, Karnataka, IN;
Shankar Chandrasekaran, Tamil Nadu, IN;
David Cecil Hays, Niskayuna, NY (US);
Victor Samper, Munich, DE;
Dirk Lange, Munich, DE;
Marko Baller, Munich, DE;
Min-yi Shih, Carson City, NV (US);
Sandip Maity, Karnataka, IN;
Willam Scott Sutherland, Haverhill, MA (US);
Anis Zribi, Rexford, NY (US);
Long Que, Rexford, NY (US);
Glenn Scott Claydon, Wynantskill, NY (US);
Stacey Joy Kennerly, Albany, NY (US);
Ayan Banerjee, Bangalore, IN;
Shivappa Ningappa Goravar, Karnataka, IN;
Shankar Chandrasekaran, Tamil Nadu, IN;
David Cecil Hays, Niskayuna, NY (US);
Victor Samper, Munich, DE;
Dirk Lange, Munich, DE;
Marko Baller, Munich, DE;
Min-Yi Shih, Carson City, NV (US);
Sandip Maity, Karnataka, IN;
General Electric Company, Niskayuna, NY (US);
Abstract
A system and method for managing optical power for controlling thermal alteration of a sample undergoing spectroscopic analysis is provided. The system includes a moveable laser beam generator for irradiating the sample and a beam shaping device for moving and shaping the laser beam to prevent thermal overload or build up in the sample. The moveable laser beam generator includes at least one beam shaping device selected from the group consisting of at least one optical lens, at least one optical diffractor, at least one optical path difference modulator, at least one moveable mirror, at least one Micro-Electro-Mechanical Systems (MEMS) integrated circuit (IC), and/or a liquid droplet. The system also includes an at least two degree of freedom (2 DOF) moveable substrate platform and a controller for controlling the laser beam generator and the substrate platform, and for analyzing light reflected from the sample.