The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Jul. 29, 2005
Jeffrey H. Fischer, Boston, MA (US);
David J. Husak, Windham, NH (US);
Pattabhiraman Krishna, Westborough, MA (US);
Jeffrey H. Fischer, Boston, MA (US);
David J. Husak, Windham, NH (US);
Pattabhiraman Krishna, Westborough, MA (US);
Reva Systems Corporation, Chelmsford, MA (US);
Abstract
A system and method for monitoring and characterizing various sources of RF interference within an RFID environment, and for adjusting the operational characteristics of an array of RFID readers within the system based on these interference characterizations. The system examines the received transmissions from readers in the network by controlling a calibration cycle or while they are operating as interrogators to determine interference parameters, and to verify the operation of the readers in the array. The system also examines outside sources of interference, and signal dependent interference. The interference characterization can also be estimated from a combination of calculations and co-monitoring.