The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Oct. 19, 2007
Applicants:
David James Ray, Agoura Hills, CA (US);
Nicholas Gregory Doe, San Ramon, CA (US);
Terence Rogers Lundy, Bolinas, CA (US);
Inventors:
David James Ray, Agoura Hills, CA (US);
Nicholas Gregory Doe, San Ramon, CA (US);
Terence Rogers Lundy, Bolinas, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A combination confocal and scanning probe microscope system permits accurate location of a sample within the field of view as the sample translates from one type of microscope to the other. Alternate embodiments permit both microscopes to view the same sample location at the same time. Further alternate embodiments include a confocal and a probe microscope integrated into a common optical path.