The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 06, 2010
Filed:
Jan. 21, 2005
Daniel W. Van Der Weide, Madison, WI (US);
Charles A. Paulson, Clearlake, MN (US);
Andrew G. Stevens, Dundas, MN (US);
Daniel W. van der Weide, Madison, WI (US);
Charles A. Paulson, Clearlake, MN (US);
Andrew G. Stevens, Dundas, MN (US);
Wisconsin Alumni Research Foundation, Madison, WI (US);
Abstract
A method disclosed for producing polymer-based cantilevers for use in atomic force microscopy in a batch process. The method includes forming a mold in a mold material, for example PDMS, using a master cantilever, removing the master cantilever from the mold material to reveal a mold cavity, filling the mold cavity with plastic, for example polystyrene, to form a plastic cantilever in the mold, and removing the plastic cantilever from the mold, for example using adhesive tape or flexing the mold. At least one surface of the plastic cantilever can be coated with a reflective metal, such as gold. The plastic cantilever can be functionalized for use in magnetic force microscopy by attaching a probe tip formed of magnetic metal, for example a 10 μm nickel sphere.