The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 06, 2010

Filed:

Apr. 22, 2005
Applicants:

Fumihisa Kitawaki, Ehime, JP;

Akihito Kamei, Kyoto, JP;

Tatsurou Kawamura, Kyoto, JP;

Inventors:

Fumihisa Kitawaki, Ehime, JP;

Akihito Kamei, Kyoto, JP;

Tatsurou Kawamura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01); G01N 27/333 (2006.01); G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sensor capable of measuring a plurality of measuring items quickly and accurately, a measuring device, and a measuring method are provided. The sensor includes a sample-holding unit for holding a sample containing an analyte; a sample-supplying port for supplying the sample to the sample-holding unit; a detecting unit for carrying out an electrochemical measurement, the unit being provided in the sample-holding unit; an optical measuring unit for carrying out an optical measurement, the unit being provided in the sample-holding unit; and a reagent-holding unit for holding a reagent for the optical measurement, the unit being provided in the sample-holding unit; wherein in the flowing direction of the sample supplied from the sample-supplying port in sample-holding unit, the sample-supplying port, the detecting unit, and the reagent-holding unit are positioned in the order recited.


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