The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 30, 2010

Filed:

Jul. 13, 2005
Applicant:

Alfred C. Hartmann, Round Rock, TX (US);

Inventor:

Alfred C. Hartmann, Round Rock, TX (US);

Assignee:

Symantec Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Data center activity traces form a corpus used for machine learning. The data in the corpus are putatively normal but may be tainted with latent anomalies. There is a statistical likelihood that the corpus represents predominately legitimate activity, and this likelihood is exploited to allow for a targeted examination of only the data representing possible anomalous activity. The corpus is separated into clusters having members with like features. The clusters having the fewest members are identified, as these clusters represent potential anomalous activities. These clusters are evaluated to determine whether they represent actual anomalous activities. The data from the clusters representing actual anomalous activities are excluded from the corpus. As a result, the machine learning is more effective and the trained system provides better performance, since latent anomalies are not mistaken for normal activity.


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